An SEM with a large specimen chamber and x-ray capability for light elements can image specimens from 15X to 30,000X. The fully digital scanning electron microscope or SEM is useful for many purposes such as examining fracture surfaces, wear surfaces, coating failures, and small manufactured components. The SEM can also be used to document parts for forensic purposes. The large chamber permits viewing larger parts without having to cut them. X-ray analysis for the elements carbon and up can be performed.
-
Stage travel is 2x4 inches but larger specimens can be viewed by repositioning the specimen. Specimens up to 3 inches tall can be viewed.
-
Minimum magnification is 15X to 30X depending upon the height of the specimen.
-
Digital measurements can be made at these low magnifications and higher. This capability allows for accurate measurements to be made on small, difficult to measure parts.
-
A qualitative elemental analysis can be made on carbon and higher elements on rough surfaces. Semiquantitative and quantitative analyses can be performed on polished, flat surfaces if appropriate standards are available.
-
Digital image analysis can be performed on surfaces. Quantitative measurements of porosity, second phases, etc can be performed.
-
Carbon nanotubes are of great interest in structural composites because of their strength and very small size. Individual broken nanotubes can be resolved in this very high magnification picture.
-
X-ray dot mapping can be used to show distribution of elements on a surface. The picture on the right shows the distribution of Chromium (green) and Sulfur (yellow) across a crack in Incoloy 800
- Digital measuring capability enabled measurements on a difficult to measure die opening.
